TY - GEN
T1 - Feasibility of on-line multiple scanning proton beam range verification with PET imaging
T2 - 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
AU - Zhong, Yuncheng
AU - Lu, Weiguo
AU - Jia, Xun
AU - Shao, Yiping
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2017/10/16
Y1 - 2017/10/16
N2 - We investigate the feasibility for intra-fraction online multiple scanning proton beam range verifications (BRVs) with in-situ PET imaging, which is beyond the single-beam BRV we had previously studies. We simulated various 132-MeV proton beams with 4-mm diameter and different beamseparations irradiating PMMA phantoms by GATE simulations. The generated nuclear interaction-induced positrons, which were distributed in either a planar or a curved positron activity range profile, were imaged by a PET (∼2-mm resolution, 17% sensitivity in the energy range from 350 keV to 650 keV, 250×250×128 mm3 field-of-view). We calculated the activity ranges (ARs) from reconstructed PET images and compared them with the corresponding ARs of the original positron distributions. Preliminary studies show that: 1) for two separated beams with overlapped positrons, errors of AR measurement for each beam varied from 0.2 mm to 2.3 mm as center-to-center beam separation and AR difference were in the range of 8-12 mm and 2-8 mm respectively. It is feasible to achieve < 1.0-mm accuracy for two beams with a 100-second PET acquisition and 12-mm beam-separation; 2) for densely distributed beams with a continuous profile of AR distributions, PET image was blurred further at non-planar AR region than planar region which led to worsened AR measurement accuracy at non-planar region. Further studies will focus on identifying key factors that impact the AR measurement with multi-beam irradiations, such as the PET resolution model and the ways to reduce the error in nonplanar regions, sensitivity, configuration, image process and enhancement, to improve beam range verifications.
AB - We investigate the feasibility for intra-fraction online multiple scanning proton beam range verifications (BRVs) with in-situ PET imaging, which is beyond the single-beam BRV we had previously studies. We simulated various 132-MeV proton beams with 4-mm diameter and different beamseparations irradiating PMMA phantoms by GATE simulations. The generated nuclear interaction-induced positrons, which were distributed in either a planar or a curved positron activity range profile, were imaged by a PET (∼2-mm resolution, 17% sensitivity in the energy range from 350 keV to 650 keV, 250×250×128 mm3 field-of-view). We calculated the activity ranges (ARs) from reconstructed PET images and compared them with the corresponding ARs of the original positron distributions. Preliminary studies show that: 1) for two separated beams with overlapped positrons, errors of AR measurement for each beam varied from 0.2 mm to 2.3 mm as center-to-center beam separation and AR difference were in the range of 8-12 mm and 2-8 mm respectively. It is feasible to achieve < 1.0-mm accuracy for two beams with a 100-second PET acquisition and 12-mm beam-separation; 2) for densely distributed beams with a continuous profile of AR distributions, PET image was blurred further at non-planar AR region than planar region which led to worsened AR measurement accuracy at non-planar region. Further studies will focus on identifying key factors that impact the AR measurement with multi-beam irradiations, such as the PET resolution model and the ways to reduce the error in nonplanar regions, sensitivity, configuration, image process and enhancement, to improve beam range verifications.
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U2 - 10.1109/NSSMIC.2016.8069550
DO - 10.1109/NSSMIC.2016.8069550
M3 - Conference contribution
AN - SCOPUS:85041495408
T3 - 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
BT - 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 29 October 2016 through 6 November 2016
ER -