Abstract
Prior knowledge about the observed scene represents the key to recovering frequencies beyond the passband of an imaging system (super-resolution). With regard to microscopy mainly two super-resolution mechanisms have been reported: 1.) analytic continuation of the frequency spectrum and 2.) constrained image deconvolution. This paper describes an alternative super-resolution mechanism. Prior knowledge is introduced on a higher, more symbolic level of visual inference. We exemplify our concept based on the 3D reconstruction of a micro-pipette moving in close proximity to immobile target objects. Information about the shape and the mobility of the pipette is incorporated in order to localize the pipette tip at sub-Rayleigh distances to the target. The algorithm was tested in a micro-robot environment. A machine vision module using stereo light microscopy automatically controlled the manipulation of microscopic objects, e.g. latex beads or diamond mono-crystals. In the theoretical part of the paper we prove that knowledge of the form `the pipette has moved between two consecutive frames of the movie' must result in a twofold increase of resolution. We used the normal flow of an image to decode positional measures from motion. In practice, super-resolution factors between 3 to 5 were obtained. The additional gain originates from the geometric constraints which were included to reconstruct the pipette position.
Original language | English (US) |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Publisher | Society of Photo-Optical Instrumentation Engineers |
Pages | 129-140 |
Number of pages | 12 |
Volume | 3919 |
State | Published - 2000 |
Event | Three-Dimensional and Multidimensional Microscopy: Image Acquisition Processing VII - San Jose, CA, USA Duration: Jan 23 2000 → Jan 24 2000 |
Other
Other | Three-Dimensional and Multidimensional Microscopy: Image Acquisition Processing VII |
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City | San Jose, CA, USA |
Period | 1/23/00 → 1/24/00 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics